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lgli/A:\usenetabtechnical\The Characterization of High Tc Mtls and Devs by Electron Microscopy - N. Browning, et al., (Cambridge, 2000) WW.pdf
Characterization of high Tc materials and devices by electron microscopy 🔍
edited by Nigel D. Browning, Stephen J. Pennycook Cambridge University Press (Virtual Publishing), 1, 2000
英语 [en] · PDF · 36.2MB · 2000 · 📘 非小说类图书 · 🚀/duxiu/lgli/lgrs/nexusstc/zlib · Save
描述
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of new superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunneling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is also discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This book will interest graduate students and researchers in condensed matter physics and material science.
备用文件名
lgrsnf/A:\usenetabtechnical\The Characterization of High Tc Mtls and Devs by Electron Microscopy - N. Browning, et al., (Cambridge, 2000) WW.pdf
备用文件名
nexusstc/Characterization of High Tc Materials and Devices by Electron Microscopy/33729bcf00d93a6f536e1fc60309d6c0.pdf
备用文件名
zlib/Technique/Experiments, Instruments & Measurements/Nigel D Browning; Stephen J Pennycook/Characterization of high Tc materials and devices by electron microscopy_2055860.pdf
备选作者
Browning, Nigel D.
备用出版商
Greenwich Medical Media Ltd
备用版本
Digitally printed 1st pbk. version., Cambridge, New York, England, 2006
备用版本
Digitally printed first paperback version, Cambridge, 2006
备用版本
Cambridge University Press, Cambridge, 2000
备用版本
United Kingdom and Ireland, United Kingdom
备用版本
Cambridge, UK, New York, England, 2000
备用版本
New Ed edition, November 23, 2006
备用版本
10700th, 2006
备用版本
July 24, 2000
备用版本
2009
元数据中的注释
usenet tech -- 2012-06
元数据中的注释
lg901594
元数据中的注释
{"edition":"1","isbns":["0511039662","0511534825","0521031702","052155490X","9780511039669","9780511534829","9780521031707","9780521554909"],"last_page":405,"publisher":"Cambridge University Press"}
元数据中的注释
Originally published: 2000.
Includes bibliographical references.
元数据中的注释
Includes bibliographical references.
备用描述
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
备用描述
"This compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy together with details of each technique and its applications." "This text will be an indispensable reference for graduate students and researchers in material science, physics and engineering."--Jacket
备用描述
High-resolution transmission electron microscopy (HRTEM) has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale.
备用描述
<p><P>A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.</p>
开源日期
2013-03-30
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