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Power-Aware Testing and Test Strategies for Low Power Devices 🔍
Laung-Terng Wang, Charles E. Stroud (auth.), Patrick Girard, Nicola Nicolici, Xiaoqing Wen (eds.) Springer US, 1st ed. 2010, New York, NY, 2010
英语 [en] · PDF · 14.3MB · 2010 · 📘 非小说类图书 · 🚀/lgli/lgrs/nexusstc/scihub/zlib · Save
描述
Power-Aware Testing and Test Strategies for Low-Power Devices
Edited by:
Patrick Girard, Research Director, CNRS / LIRMM, France
Nicola Nicolici, Associate Professor, McMaster University, Canada
Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan
Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices.
1. The first comprehensive book on power-aware test for (low-power) circuits and systems
2. Shows readers how low-power devices can be tested safely without affecting yield and reliability
3. Includes necessary background information on design-for-test and low-power design
4. Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression
5. Presents state-of-the-art industrial practices and EDA solutions
备用文件名
lgrsnf/A:\compressed\10.1007%2F978-1-4419-0928-2.pdf
备用文件名
nexusstc/Power-Aware Testing and Test Strategies for Low Power Devices/eab460d8c4c911b22f1114e0de308189.pdf
备用文件名
scihub/10.1007/978-1-4419-0928-2.pdf
备用文件名
zlib/Engineering/Laung-Terng Wang, Charles E. Stroud (auth.), Patrick Girard, Nicola Nicolici, Xiaoqing Wen (eds.)/Power-Aware Testing and Test Strategies for Low Power Devices_2097034.pdf
备选作者
Patrick Girard, Nicola Nicolici, Xiaoqing Wen, Girard, Patrick Ph. D
备选作者
Patrick Girard, Nicola Nicolici, Xiaoqing Wen, editors
备选作者
Girard, Patrick Ph. D., Nicola Nicolici, Xiaoqing Wen
备选作者
Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing
备选作者
Jean-Pierre Aubin; Hélène Frankowska
备用出版商
Springer London, Limited
备用版本
United States, United States of America
备用版本
Springer Nature, New York, 2009
备用版本
New York, New York State, 2010
备用版本
New York ; London, 2010
备用版本
2010, 2009
元数据中的注释
sm23186435
元数据中的注释
{"edition":"1","isbns":["1441909273","1441909281","9781441909275","9781441909282"],"last_page":363,"publisher":"Springer US"}
元数据中的注释
Includes bibliographical references and index.
备用描述
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
备用描述
Front Matter....Pages i-xxiii
Fundamentals of VLSI Testing....Pages 1-29
Power Issues During Test....Pages 31-63
Low-Power Test Pattern Generation....Pages 65-115
Power-Aware Design-for-Test....Pages 117-146
Power-Aware Test Data Compression and BIST....Pages 147-173
Power-Aware System-Level Test Planning....Pages 175-211
Low-Power Design Techniques and Test Implications....Pages 213-242
Test Strategies for Multivoltage Designs....Pages 243-271
Test Strategies for Gated Clock Designs....Pages 273-293
Test of Power Management Structures....Pages 295-322
EDA Solution for Power-Aware Design-for-Test....Pages 323-353
Back Matter....Pages 355-363
备用描述
Keine Beschreibung vorhanden.
Erscheinungsdatum: 23.11.2009
开源日期
2013-08-01
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