Introduction To Electron Beam Instruments -- Electron-specimen Interactions -- Layout And Operational Modes Of Electron Beam Instruments -- Interpretation Of Diffraction Information -- Analysis Of Micrographs In Tem, Stem, Hrem, And Sem -- Interpretation Of Analytical Data. M.h. Loretto. Includes Bibliographies And Index. The second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis available today.

zlibzh/no-category/M. H. Loretto/ELECTRON BEAM ANALYSIS OF MATERIALS_117049497.pdf

Loretto, M. H.

International Thomson Computer Press

Cengage Learning EMEA

Thomson Learning

Springer

United Kingdom and Ireland, United Kingdom

London, New York, England, 1984

Springer Nature, London, 1984

1, 1984-11-15

related_files:
filepath:02/ELECTRON BEAM ANALYSIS OF MATERIALS_40564916.zip — md5:7ccd07532663311774b82df0931f7897 — filesize:51598607
filepath:ELECTRON BEAM ANALYSIS OF MATERIALS_40564916.zip — md5:058f1826ca9a3c97f67fabb43fd1a878 — filesize:51598607
filepath:/读秀/读秀4.0/读秀/4.0/数据库42-3/ELECTRON BEAM ANALYSIS OF MATERIALS_40564916.zip

Includes bibliographies and index.

The microstructure of materials controls many of their important physical, mechanical and electrical properties. In order to understand and control these properties it is essential to assess microstructure at a resolution down to atomic level. This second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis, used to examine these microstructures, available today.
The text provides detailed coverage of both fundamental principles and practical aspects of the many electron beam techniques that have been developed. These include: transmission electron microscopy, scanning transmission electron microscopy, scanning electron microscopy, conventional and convergent electron diffraction, Auger electron spectroscopy, electron energy loss spectroscopy and electron probe microanalysis techniques.
The importance of understanding the operation of the equipment and of the simple theory underlying the significance of the data is emphasized. This emphasis is becoming increasingly important as computer solutions of data and computer control of equipment are tending to obscure the understanding of the analysis of data and of the operation of the equipment.
Written for researchers, senior undergraduates and graduates in material science, solid state physicists and chemists as well as practitioners of electron beam analysis, its well organized presentation serves to put the various techniques into perspective by examining similarities and differences.

The examination of materials using electron beam techniques has developed continuously for over twenty years and there are now many different methods of extracting detailed structural and chemical information using electron beams. These techniques which include electron probe microanalysis, trans­ mission electron microscopy, Auger spectroscopy and scanning electron microscopy have, until recently, developed more or less independently of each other. Thus dedicated instruments designed to optimize the performance for a specific application have been available and correspondingly most of the available textbooks tend to have covered the theory and practice of an individual technique. There appears to be no doubt that dedicated instru­ ments taken together with the specialized textbooks will continue to be the appropriate approach for some problems. Nevertheless the underlying electron-specimen interactions are common to many techniques and in view of the fact that a range of hybrid instruments is now available it seems appropriate to provide a broad-based text for users of these electron beam facilities. The aim of the present book is therefore to provide, in a reasonably concise form, the material which will allow the practitioner of one or more of the individual techniques to appreciate and to make use of the type of information which can be obtained using other electron beam techniques.

2024-06-13