Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and'inner space.'However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training.

Egerton, R.F.

Egerton, R. F

New York, NY: Springer

Copernicus

Telos

1st ed. 2005. Corr. 2nd printing 2011, PS, 2005

United States, United States of America

New York, New York State, 2005

July 17, 2007

Includes bibliographical references (p. [195]-196) and index.

Ch. 1. An Introduction To Microscopy -- 1.1 Limitations Of The Human Eye -- 1.2 The Light-optical Microscope -- 1.3 The X-ray Microscope -- 1.4 The Transmission Electron Microscope -- 1.5 The Scanning Electron Microscope -- 1.6 Scanning Transmission Electron Microscope -- 1.7 Analytical Electron Microscopy -- 1.8 Scanning-probe Microscopes -- Ch. 2. Electron Optics -- 2.1 Properties Of An Ideal Image -- 2.2 Imaging In Light Optics -- 2.3 Imaging With Electrons -- 2.4 Focusing Properties Of A Thin Magnetic Lens -- 2.5 Comparison Of Magnetic And Electrostatic Lenses -- 2.6 Defects Of Electron Lenses -- Ch. 3. The Transmission Electron Microscope -- 3.1 The Electron Gun -- 3.2 Electron Acceleration -- 3.3 Condenser-lens System -- 3.4 The Specimen Stage -- 3.5 Tem Imaging System -- 3.6 Vacuum System -- Ch. 4. Tem Specimens And Images -- 4.1 Kinematics Of Scattering By An Atomic Nucleus -- 4.2 Electron-electron Scattering -- 4.3 The Dynamics Of Scattering --^ 4.4 Scattering Contrast From Amorphous Specimens -- 4.5 Diffraction Contrast From Polycrystalline Specimens -- 4.6 Dark-field Images -- 4.7 Electron-diffraction Patterns -- 4.8 Diffraction Contrast Within A Single Crystal -- 4.9 Phase Contrast In The Tem -- 4.10 Tem Specimen Preparation -- Ch. 5. The Scanning Electron Microscope -- 5.1 Operating Principle Of The Sem -- 5.2 Penetration Of Electrons Into A Solid -- 5.3 Secondary-electron Images -- 5.4 Backscattered-electron Images -- 5.5 Other Sem Imaging Modes -- 5.6 Sem Operating Conditions -- 5.7 Sem Specimen Preparation -- 5.8 The Environmental Sem -- 5.9 Electron-beam Lithography -- Ch. 6. Analytical Electron Microscopy -- 6.1 The Bohr Model Of The Atom -- 6.2 X-ray Emission Spectroscopy -- 6.3 X-ray Energy-dispersive Spectroscopy -- 6.4 Quantitative Analysis In The Tem -- 6.5 Quantitative Analysis In The Sem -- 6.6 X-ray Wavelength-dispersive Spectroscopy -- 6.7 Comparison Of Xeds And Xwds Analysis --^ 6.8 Auger Electron Spectroscopy -- 6.9 Electron Energy-loss Spectroscopy -- Ch. 7. Recent Developments -- 7.1 Scanning Transmission Electron Microscopy -- 7.2 Aberration Correction -- 7.3 Electron-beam Monochromators -- 7.4 Electron Holography -- 7.5 Time-resolved Microscopy -- Appendix: Mathematical Derivations -- A.1 The Schottky Effect -- A.2 Impact Parameter In Rutherford Scattering. Ray F. Egerton. Includes Bibliographical References (p. [195]-196) And Index.

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, "Physical Principles of Electron Microscopy" is appropriate for undergraduates and technologists with limited mathematical training

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

"Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy, for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy."--BOOK JACKET

Microscopy involves the study of objects that are too small to be examined by the unaided eye.

Keine Beschreibung vorhanden.
Erscheinungsdatum: 03.08.2005

2023-06-28