This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. __Physical Principles of Electron Microscopy, Second Edition__, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.

lgli/K:/!genesis/!repository8/springer/10.1007%2F978-3-319-39877-8.pdf

lgrsnf/K:/!genesis/!repository8/springer/10.1007%2F978-3-319-39877-8.pdf

nexusstc/Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM/8acb1a97bee8d92fbdc38c1861b24762.pdf

scihub/10.1007/978-3-319-39877-8.pdf

zlib/Engineering/R.F. Egerton/Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM_5206328.pdf

Egerton, R.F.

R. F. Egerton

Ray Egerton

Springer Nature Switzerland AG

Springer London, Limited

Springer Nature (Textbooks & Major Reference Works), Switzerland, 2016

Second edition, Switzerland, 2016

Second edition, Cham, 2016

Switzerland, Switzerland

2, PT, 2016

0

sm56854890

producers:
Acrobat Distiller 10.0.0 (Windows)

{"edition":"2","isbns":["3319398768","3319398776","9783319398761","9783319398778"],"last_page":196,"publisher":"Springer"}

Preface 6
Contents 8
1 An Introduction to Microscopy 11
1.1 Limitations of the Human Eye 11
1.2 The Light-Optical Microscope 15
1.3 The X-ray Microscope 18
1.4 The Transmission Electron Microscope 19
1.5 The Scanning Electron Microscope 25
1.6 Scanning Transmission Electron Microscope 26
1.7 Analytical Electron Microscopy 29
1.8 Low-Energy and Photoelectron Microscopes 29
1.9 Field-Emission and Atom-Probe Microscopy 30
1.10 Scanning-Probe Microscopes 32
1.11 Further Reading 35
2 Electron Optics 37
2.1 Properties of an Ideal Image 37
2.2 Imaging in Light Optics 39
2.3 Imaging with Electrons 42
2.4 Focusing Properties of a Thin Magnetic Lens 48
2.5 Comparison of Magnetic and Electrostatic Lenses 51
2.6 Defects of Electron Lenses 52
2.7 Aberration Correctors and Monochromators 61
2.8 Further Reading 63
3 The Transmission Electron Microscope 65
3.1 The Electron Gun 66
3.1.1 Thermionic Emission 66
3.1.2 Schottky Emission 69
3.1.3 Field Emission 70
3.1.4 Comparison of Electron Sources; Source Brightness 71
3.2 Electron Acceleration 73
3.3 Condenser-Lens System 77
3.3.1 Condenser Aperture 79
3.3.2 Condenser Stigmator 80
3.3.3 Illumination Shift and Tilt Controls 81
3.4 The Specimen Stage 81
3.5 TEM Imaging System 84
3.5.1 Objective Lens 84
3.5.2 Objective Aperture 85
3.5.3 Objective Stigmator 88
3.5.4 Selected-Area Aperture 88
3.5.5 Intermediate Lens 89
3.5.6 Projector Lens 89
3.5.7 TEM Screen and Camera System 90
3.5.8 Depth of Focus and Depth of Field 91
3.6 Scanning Transmission Systems 93
3.7 Vacuum System 94
3.8 Further Reading 98
4 TEM Specimens and Images 99
4.1 Kinematics of Scattering by an Atomic Nucleus 100
4.2 Electron-Electron Scattering 102
4.3 The Dynamics of Scattering 103
4.4 Scattering Contrast from Amorphous Specimens 106
4.5 Diffraction Contrast from Polycrystalline Specimens 111
4.6 Dark-Field Images 113
4.7 Electron-Diffraction Patterns 113
4.8 Diffraction Contrast from a Single Crystal 117
4.9 Phase Contrast in the TEM 120
4.10 STEM Images 124
4.11 TEM Specimen Preparation 125
4.12 Further Reading 129
5 The Scanning Electron Microscope 131
5.1 Operating Principle of the SEM 131
5.2 Penetration of Electrons into a Solid 134
5.3 Secondary-Electron Images 136
5.4 Backscattered-Electron Images 141
5.5 Other SEM Imaging Modes 144
5.6 SEM Operating Conditions 148
5.7 SEM Specimen Preparation 152
5.8 The Environmental SEM 153
5.9 Electron-Beam Lithography 155
5.10 Further Reading 157
6 Analytical Electron Microscopy 158
6.1 The Bohr Model of the Atom 158
6.2 X-Ray Emission 161
6.3 X-Ray Energy-Dispersive Spectroscopy 164
6.4 Quantitative Analysis in the TEM 168
6.5 Quantitative Analysis in the SEM 169
6.6 X-Ray Wavelength-Dispersive Spectroscopy 170
6.7 Comparison of XEDS and XWDS Analysis 172
6.8 Auger-Electron Spectroscopy 173
6.9 Electron Energy-Loss Spectroscopy 174
6.10 Further Reading 178
7 Special Topics 179
7.1 Environmental TEM 179
7.2 Radiation Damage 181
7.3 Electron Tomography 184
7.4 Electron Holography 185
7.5 Time-Resolved Microscopy 189
7.6 Further Reading 192
Appendix: Mathematical Derivations 193
Index 198

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition , is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

"Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy, for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy."--BOOK JACKET

Front Matter....Pages i-xi
An Introduction to Microscopy....Pages 1-26
Electron Optics....Pages 27-54
The Transmission Electron Microscope....Pages 55-88
TEM Specimens and Images....Pages 89-120
The Scanning Electron Microscope....Pages 121-147
Analytical Electron Microscopy....Pages 149-169
Special Topics....Pages 171-184
Back Matter....Pages 185-196

Keine Beschreibung vorhanden.
Erscheinungsdatum: 07.07.2016

2016-07-20