The purpose of this conference is to bring together people with a common interest in the techniques of
The purpose of this conference is to bring together people with a common interest in the techniques of soft x-ray and VUV instrumentation calibrations.

Techniques, Sources and Detectors : (proceedings of the Meeting); San Diego - Calif., 19-20 August 1986 : Part of a Four-conference Program on X-Ray Optics Held at SPIE's 30th Annual International Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering

Proceedings of SPIE-The International Society for Optical Engineering Volume 689·X-Ray Calibration: Techniques,Sources and Detectors

X-ray Calibration: Techniques, Sources, And Detectors (proceedings Of Spie--the International Society For Optical Engineering)

X-RAY CALIBRATION : TECHNIQUES, SOURCES AND DETECTORS : conference, San Diego, Aug. 1986, proceedings

X-ray calibration techniques, sources and detectors; 19 - 20 August 1986, San Diego, California

Novel Applications and Recent Developments : 21-22 August 1986, San Diego, California

X Rays in Materials Analysis

Paul D. Rockett, Ping Lee, chairmen/editors; cooperating organizations, Institute of Optics/University of Rochester ... [et al.]

Rockett, Paul D; Lee, Ping; University of Rochester. Institute of Optics

Paul D Rockett; Ping Lee; University of Rochester Institute of Optics

Paul D.; Lee, Ping (eds); Et.al. Rockett

Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

Proceedings of SPIE--the International Society for Optical Engineering ;, v. 689, Bellingham, Wash., USA, Washington State, 1986

Proceedings of SPIE - The International Society for Optical Engineering, vol. 689, Bellingham, 1986

SPIE, The International Society for Optical Engineering, 689, Bellingham, Wash, 1986

United States, United States of America

1, 1986

Cut-off text on some pages due to tight binding

Includes bibliographies and index.
"[Meeting held] 19-20 August 1986, San Diego, California."

Includes bibliographical and index.

contributor: 浙江大学

format: Image/Djvu(.djvu)

unit_name: 浙江大学

Type: 英文图书

Bookmarks:
1. (p1) Session 1 Sources,Detectors,And Filters I
1.1. (p2) Absolute intensity measurements in the vacuum ultraviolet
1.2. (p6) A Penning discharge source for extreme ultraviolet calibration
1.3. (p11) A high intensity line source for x-ray spectrometer calibration
1.4. (p19) Laser produced plasma x-ray ultraviolet (XUV) radiation source
1.5. (p26) Maximization of bremsstrahlung and K-series production efficiencies in flash x-ray tubes
2. (p33) SESSION 1 (Continued) SOURCES,DETECTORS,AND FILTERS II
2.1. (p34) Variable pressure ion chamber for relative and absolute flux measurement
2.2. (p40) Calibration of photon counting imaging microchannel plate detectors for EUV astronomy
3. (p49) Session 2 Instrument Calibrations I
3.1. (p50) Calibration of a 1 meter diameter normal incidence extreme ultraviolet telescope/spectrometer
3.2. (p54) Absolute sensitivity calibration from 20 A to 430 A of a grazing incidence spectrometer with a multi-element spectral detector
3.3. (p61) A slitless,intensified readout,gated spectrometer:wavelength and efficiency calibration,time response characterization
4. (p69) SESSION 2 (Continued) INSTRUMENT CALIBRATIONS II
4.1. (p70) VUV spectrometer-detector system calibration using synchrotron radiation
4.2. (p77) Synchrotron radiation calibration of the SPRED VUV spectrograph at the NBS SURF II electron storage ring
4.3. (p82) Wolter x-ray microscope calibration
4.4. (p87) Characterization of the absolute photon sensitivity of gold cathode photoelectric detectors
5. (p93) Session 3 Component Characterization:Reflectivity,Transmission,And Scattering
5.1. (p94) Techniques of absolute low energy x-ray calibration
5.2. (p102) Optical surface evaluation by soft x-ray scattering
5.3. (p108) Evaluation of gratings for the Extreme Ultraviolet Explorer
6. (p113) SESSION 3 (Continued) MATERIAL CHARACTERIZATION:REFLECTIVITY,TRANSMISSION,AND SCATTERING
6.1. (p114) Crystal Rc calibrations with an uncollimated,point x-ray source
6.2. (p121) Soft x-ray calibration of diffracting materials
6.3. (p128) Development and performance of the radiation entrance window in the ROSAT position sensitive proportional counter PSPC
6.4. (p138) Calibration of the thin film filters to be used on the Extreme Ultraviolet Explorer satellite
6.5. (p144) Absolute calibration of a soft x-ray streak camera
7. (p151) Sfssiqn 4 X-Ray/Vuv Calibration Facilties I
7.1. (p155) Facilities and techniques for x-ray diagnostic calibration in the 100-eV to 100-keV energy range
7.2. (p167) The soft x-ray/EUV calibration facility at the University of Colorado
7.3. (p178) XUV radiometric standards at NBS
7.4. (p188) Synchrotron radiation beam lines as x-ray calibration sources
8. (p199) SESSION 4 (Continued) X-RAY/VUV CALIBRATION FACILITIES II
8.1. (p200) VUV-soft x-ray beamline for spectroscopy and calibration
8.2. (p208) Los Alamos x-ray characterization facilities for plasma diagnostics
8.3. (p218) Vacuum interface to a soft x-ray synchrotron beam line
9. (p223) Additional Papers
9.1. (p224) Problems and approaches to the calibration of solar EUV instrumentation in space
9.2. (p231) Performance of oblique angle of incidence collection systems in the VUV
9.3. (p238) Tokamak as an x-ray/XUV light source
9.4. (p244) Direct x-ray response of charge-coupled devices and photodiode linear arrays

vi, 254 pages : 28 cm
Includes bibliographies and index

2024-07-01