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nexusstc/Microelectronic Test Structures for CMOS Technology/386a794bbb00cfd209ed822dd05addba.pdf
Microelectronics test structures for CMOS technology and products 🔍
Manjul Bhushan, Mark B. Ketchen (auth.) Springer-Verlag New York, 1st ed. 2011, New York, NY, 2011
英语 [en] · PDF · 13.3MB · 2011 · 📘 非小说类图书 · 🚀/lgli/lgrs/nexusstc/scihub/zlib · Save
描述
__Microelectronic Test Structures for CMOS Technology and Products__ addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
备用文件名
lgli/_459265.386a794bbb00cfd209ed822dd05addba.pdf
备用文件名
lgrsnf/_459265.386a794bbb00cfd209ed822dd05addba.pdf
备用文件名
scihub/10.1007/978-1-4419-9377-9.pdf
备用文件名
zlib/Engineering/Manjul Bhushan, Mark B. Ketchen (auth.)/Microelectronic Test Structures for CMOS Technology_1174722.pdf
备选作者
by Manjul Bhushan, Mark B. Ketchen
备选作者
Bhushan, Manjul, Ketchen, Mark B.
备选作者
Mark B Ketchen; Manjul Bhushan
备用出版商
Springer New York : Imprint : Springer
备用出版商
Springer Science+Business Media, LLC
备用版本
United States, United States of America
备用版本
New York, NY, New York State, 2011
备用版本
Springer Nature, New York, 2011
元数据中的注释
2011 12 30
元数据中的注释
sm41108663
元数据中的注释
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元数据中的注释
MiU
备用描述
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. ¡Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors{u2019} overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology
备用描述
Front Matter....Pages i-xxxiv
Introduction....Pages 1-10
Test Structure Basics....Pages 11-65
Resistors....Pages 67-105
Capacitors....Pages 107-138
MOSFETs....Pages 139-172
Ring Oscillators....Pages 173-229
High-Speed Characterization....Pages 231-257
Test Structures for SOI Technology....Pages 259-290
Test Equipment and Measurements....Pages 291-315
Data Analysis....Pages 317-358
Back Matter....Pages 359-373
备用描述
Keine Beschreibung vorhanden.
Erscheinungsdatum: 30.08.2011
开源日期
2012-02-04
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