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nexusstc/Characterisation of displacement cascade damage in Cu/sub 3/Au produced by fusion-neutron irradiation/18ccc350c9e3e05454addb1db7fe89be.pdf
Characterisation of displacement cascade damage in Cu/sub 3/Au produced by fusion-neutron irradiation 🔍
C A English Affiliation: UKAEA Atomic Energy Research Establishment, Harwell. Metallurgy Div.; M L Jenkins; M A Kirk Affiliation: Oxford Univ. (UK). Dept. of Metallurgy and Science of Materials Institute of Physiscs Publishing, CRC Press (Unlimited), Bristol [England], 2001
英语 [en] · PDF · 7.1MB · 2001 · 📘 非小说类图书 · 🚀/lgli/lgrs/nexusstc/zlib · Save
描述
As the selection of material for particular engineering properties becomes increasingly important in keeping costs down, methods for evaluating material properties also become more relevant. One such method examines the geometry of grain boundaries, which reveals much about the properties of the material.Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications. The book also includes a glossary of terms.Exploring both the experimental and analytical aspects of the subject, this practical reference guide is essential for researchers and students involved in material properties, whether in physics, materials science, metallurgy, or physical chemistry.
备用文件名
lgli/A:\usenetabtechnical\Characterisation of Radiation Damage by Transmission Electron Microscopy - M. Jenkins, M. Kirk (IOP, 2001) WW.pdf
备用文件名
lgrsnf/A:\usenetabtechnical\Characterisation of Radiation Damage by Transmission Electron Microscopy - M. Jenkins, M. Kirk (IOP, 2001) WW.pdf
备用文件名
zlib/Physics/Nuclear/C A English Affiliation: UKAEA Atomic Energy Research Establishment, Harwell. Metallurgy Div.; M L Jenkins; M A Kirk Affiliation: Oxford Univ. (UK). Dept. of Metallurgy and Science of Materials/Characterisation of displacement cascade damage in Cu/sub 3/Au produced by fusion-neutron irradiation_2059890.pdf
备选标题
Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science)
备选标题
Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
备选标题
Topics in Electron Diffraction and Microscopy of Materials (Series in Microscopy in Materials Science)
备选标题
The Measurement Of Grain Boundary Geometry (series In Microscopy In Materials Science)
备选标题
Characterization of radiation damage by transmission electron microscopy
备选标题
Electron Microscopy of Interfaces in Metals and Alloys
备选标题
Atlas Of Backscattering Kikuchi Diffraction Patterns,
备选作者
David J. Dingley; Karim Z. Baba-Kishi; Valerie Randle
备选作者
David J Dingley; K Z Baba Kishi; V Randle
备选作者
C.T. Forwood and L.M. Clarebrough
备选作者
C. T Forwood; L. M Clarebrough
备选作者
Peter B Hirsch; Symposium
备选作者
[edited by] P. B. Hirsch
备选作者
Jenkins, M.L, Kirk, M.A
备选作者
Dingley, D. J.
备选作者
Hirsch, P. B.
备用出版商
Crc Press 1991-01-01
备用出版商
Crc Press 1995-02-23
备用出版商
IOP Publishing Ltd
备用出版商
Taylor & Francis
备用出版商
Adam Hilger
备用出版商
Routledge
备用版本
Series in microscopy in materials science, Microscopy in materials science series, Bristol, Philadelphia, England, 2001
备用版本
Electron microscopy in materials science series, Bristol, England, Philadelphia, England, 1991
备用版本
Microscopy in materials science series, Bristol, Eng, Philadelphia, Pa, England, 1995
备用版本
Electron microscopy in materials science series, Bristol, Philadelphia, England, 1993
备用版本
Series in microscopy in materials science, Bristol [England] ; Philadelphia, ©2001
备用版本
Microscopy in materials science series, Bristol, England, 1999
备用版本
Microscopy in materials science series, Bristol, cop. 1999
备用版本
CRC Press (Unlimited), Philadelphia, PA, 1999
备用版本
United Kingdom and Ireland, United Kingdom
备用版本
CRC Press (Unlimited), [N.p.], 2017
备用版本
CRC Press (Unlimited), [N.p.], 1991
备用版本
November 21, 2000
备用版本
1, 1991
备用版本
1, 1993
备用版本
1, 1994
备用版本
1, 1999
元数据中的注释
usenet tech -- 2012-06
元数据中的注释
lg905634
元数据中的注释
{"last_page":234,"publisher":"IOP"}
元数据中的注释
Includes bibliographical references.
元数据中的注释
Includes bibliographical references (p. [157]-165) and index.
元数据中的注释
"Articles presented at a symposium held in Oxford on 18 September 1997 in honour of Professor M J Whelan ..." - pref.
Includes bibliographical references.
元数据中的注释
Includes bibliographical references (p. 216-221) and index.
元数据中的注释
Includes bibliographical references (p. [408]-414) and indexes.
备用描述
<p>Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.</p><p>The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.</p>
备用描述
<p>Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.</p>
备用描述
Contents......Page 5
Preface......Page 9
1. The role of transmission electron microscopy in characterizing radiation damage......Page 11
2. An introduction to the available contrast mechanisms and experimental techniques......Page 16
3. Analysis of small centres of strain: the determination of loop morphologies......Page 37
4. Analysis of small centres of strain: determination of the vacancy or interstitial nature of small clusters......Page 84
5. Analysis of small centres of strain: counting and sizing small clusters......Page 120
6. Characterization of voids and bubbles......Page 139
7. Techniques for imaging displacement cascades......Page 155
8. High-resolution imaging of radiation damage......Page 169
9. In situ irradiation experiments......Page 183
10. Applications of analytical techniques......Page 204
11. Radiation damage in amorphous glasses......Page 218
Appendices......Page 224
References......Page 226
Index......Page 232
备用描述
Topics in Electron Diffraction and Microscopy of Materials is written for researchers in materials science, metallurgy and physics. It provides a useful overview of current applications for selected electron microscope techniques which have become important and widespread in their use for furthering our understanding of how materials behave.This edited volume has been prepared to celebrate the retirement of Professor Michael Whelan, who taught many of today's heads of department, and was a pioneer in the development and use of electron microscopy. Sir Peter Hirsch has edited the presentations made by Professor Whelan's collaborators and colleagues, each one of whom has made important advances to the technique on which they write, to form a cohesive work. Topics throughout the book are linked through the dynamical theory of electron diffraction and inelastic scattering.
备用描述
1. The Role Of Transmission Electron Microscopy In Characterizing Radiation Damage -- 2. An Introduction To The Available Contrast Mechanisms And Experimental Techniques -- 3. Analysis Of Small Centres Of Strain: The Determination Of Loop Morphologies -- 4. Analysis Of Small Centres Of Strain: Determination Of The Vacancy Or Interstitial Nature Of Small Clusters -- 5. Analysis Of Small Centers Of Strain: Counting And Sizing Small Clusters -- 6. Characterization Of Voids And Bubbles -- 7. Techniques For Imaging Displacement Cascades -- 8. High-resolution Imaging Of Radiation Damage -- 9. In Situ Irradiation Experiments -- 10. Applications Of Analytical Techniques -- 11. Radiation Damage In Amorphous Glasses -- A. The Thompson Tetrahedron. M.l. Jenkins, M.a. Kirk. Includes Bibliographical References And Index.
备用描述
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
备用描述
Examines the structure of interfaces in metals and alloys using transmission electron microscopy. This book describes the methods used for identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs.
备用描述
Studying material properties from their geometrical measurements, this work provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. Each step of the analysis process is clearly described, from data collection through processing to applications.
备用描述
Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.
备用描述
This monograph describes the principles and methods for obtaining backscattering Kikuchi diffraction patterns in the scanning electron microscope for the purpose of identifying a range of crystalline phases in metals, semiconductors, ceramics and minerals.
备用描述
Transmission electron microscopy (TEM) is probably the most important and widely used method of characterization in materials science.
备用描述
Articles presented at a symposium held in Oxford on 18 September 1997.
开源日期
2013-03-30
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